Journal de Physique IV

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Cryogenic detector systems for materials analysis

J. Höhne, M. Bühler, F.V. Feilitzsch, J. Jochum, T. Hertrich, C. Hollerith, M. Huber, J. Nicolosi, K. Phelan, D. Redfern et al. (3 more)

J. Phys. IV France, 12 3 (2002) 127-128

DOI: 10.1051/jp420020050

J. Höhne

M. Bühler

F.V. Feilitzsch

J. Jochum

T. Hertrich

C. Hollerith

M. Huber

J. Nicolosi

K. Phelan

D. Redfern

B. Simmnacher

R. Weiland

D. Wernicke

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Copyright / Publiée par : EDP Sciences