Cryogenic operation of sub-30 nm nMOSFETs: Impact of device architecture G. Bertrand, S. Deleonibus, D. Souil, B. Previtali, C. Caillat, G. Guégan, M. Sanquer et F. Balestra J. Phys. IV France, 12 3 (2002) 45-49 DOI: 10.1051/jp420020034