Journal de Physique IV

Dental depth profilometric diagnosis of pit & fissure caries using frequency-domain infrared photothermal radiometry and modulated laser luminescence

R.J. Jeon, A. Mandelis, V. Sanchez and S.H. Abrams

J. Phys. IV France, 125 (2005) 741-744

DOI: 10.1051/jp4:2005125170

R.J. Jeon

A. Mandelis

V. Sanchez

S.H. Abrams

Articles written by ALL the selected authors (AND)

Articles written by ANY OF the selected authors (OR)