Journal de Physique IV

Scanning thermal microscopy based on a modified atomic force microscope combined with pyroelectric detection

J.-S. Antoniow, M. Chirtoc, N. Trannoy, O. Raphael and J. Pelzl

J. Phys. IV France, 125 (2005) 113-116

DOI: 10.1051/jp4:2005125026

J.-S. Antoniow

M. Chirtoc

N. Trannoy

O. Raphael

J. Pelzl

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