Journal de Physique IV

0

Subscriber Authentication Point

EDPS Account

Rechercher

Menu

High lateral resolution spectroscopic imaging of surfaces: The undulator beamline “nanospectroscopy” at Elettra

A. Locatelli, A. Bianco, D. Cocco, S. Cherifi, S. Heun, M. Marsi, M. Pasqualetto and E. Bauer

J. Phys. IV France, 104 (2003) 99-102

DOI: 10.1051/jp4:200300038

A. Locatelli

A. Bianco

D. Cocco

S. Cherifi

S. Heun

M. Marsi

M. Pasqualetto

E. Bauer

Articles written by ALL the selected authors (AND)

Articles written by ANY OF the selected authors (OR)

Copyright / Publiée par : EDP Sciences