Journal de Physique IV

Residual stress mapping by micro X-ray diffraction: Application to the study of thin film buckling

P. Goudeau, P. Villain, N. Tamura, R.S. Celestre and H. Padmore

J. Phys. IV France, 12 6 (2002) 409-416

DOI: 10.1051/jp4:20020249

P. Goudeau

P. Villain

N. Tamura

R.S. Celestre

H. Padmore

Articles written by ALL the selected authors (AND)

Articles written by ANY OF the selected authors (OR)