Journal de Physique IV

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Electron diffraction (LACBED) and HRTEM Moiré fringe pattern study of stress in YBaCuO thin film on Mg0

F. Pailloux and R.J. Gaboriaud

J. Phys. IV France, 10 PR6 (2000) Pr6-131-Pr6-135

DOI: 10.1051/jp4:2000623

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