Journal de Physique IV

Apport des techniques XRFS et LEEIXS à l'étude de la formation de films de silice sur acier par PACVD

N. Bahlawane, M. Charbonnier and M. Romand

J. Phys. IV France, 08 PR5 (1998) Pr5-271-Pr5-278

DOI: 10.1051/jp4:1998534

N. Bahlawane

M. Charbonnier

M. Romand

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