Journal de Physique IV

XAFS Studies of Self-Aligned Platinum Silicide Thin Films at the Pt M_3,2 Edge and the Si K-Edge

S.J. Naftel, A. Bzowski, T.K. Sham, D.-X. Xu and S.R. Das

J. Phys. IV France, 7 C2 (1997) C2-1131-C2-1132

DOI: 10.1051/jp4:19972158

S.J. Naftel

A. Bzowski

T.K. Sham

D.-X. Xu

S.R. Das

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