Journal de Physique IV

Evolution of Interface Structure in Ni-C Multilayers Depending on Annealing Temperature : Use of Embedded Co Sublayers-Markers

V.A. Chernov, N.I. Chkhalo and S.G. Nikitenko

J. Phys. IV France, 7 C2 (1997) C2-699-C2-700

DOI: 10.1051/jp4:1997209

V.A. Chernov

N.I. Chkhalo

S.G. Nikitenko

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