Journal de Physique IV

Bias Dependent Hot-Carrier Reliability and Lifetime over a Wide Temperature Range

C. Hwang, J. Gillick, C. Jenq, B. Hammond and J. Woo

J. Phys. IV France, 06 C3 (1996) C3-25-C3-28

DOI: 10.1051/jp4:1996304

C. Hwang

J. Gillick

C. Jenq

B. Hammond

J. Woo

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