Journal de Physique IV

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HIGH RESOLUTION ELECTRON BEAM INJECTION IN SEMICONDUCTORS USING A SCANNING TUNNELING MICROSCOPE

S.F. ALVARADO, Ph. RENAUD and H.P. MEIER

J. Phys. IV France, 01 C6 (1991) C6-271-C6-275

DOI: 10.1051/jp4:1991641

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