Journal de Physique IV

INFRARED LBIC SCAN MAPS APPLIED TO ALUMINIUM GETTERED MULTICRYSTALLINE SILICON WAFERS

J.Y. NATOLI, M. PASQUINELLI, F. FLORET and S. MARTINUZZI

J. Phys. IV France, 01 C6 (1991) C6-237-C6-238

DOI: 10.1051/jp4:1991637

J.Y. NATOLI

M. PASQUINELLI

F. FLORET

S. MARTINUZZI

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