Exploring the fundamental effects of miniaturisation on ferroelectrics by focused ion beam processing of single crystal material M.M. Saad, P. Baxter, A. Schilling, T. Adams, X. Zhu, R.M. Bowman, J.M. Gregg, P. Zubko, F.D. Morrison et J.F. ScottJ. Phys. IV France, 128 (2005) 63-70DOI: https://doi.org/10.1051/jp4:2005128010
