Submicron imaging in the EUV spectral range using high-harmonic radiation M. Wieland, R. Früke, T. Wilhein, U. Kleineberg, M. Pohl, Ch. Spielmann et F. KrauszJ. Phys. IV France, 104 (2003) 149-152DOI: https://doi.org/10.1051/jp4:200300050
