Transient lattice dynamics in fs-laser-excited semiconductors probed by ultrafast X-ray diffraction
K. Sokolowski-Tinten, M. Horn von Hoegen, D. von der Linde, A. Cavalleri, C. W. Siders, F. L.H. Brown, D. M. Leitner, Cs. Tóth, J. A. Squier, C. P.J. Barty, K. R. Wilson et M. Kammler
