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Cited article:

Caractérisation par ellipsométrie spectroscopique de films minces de tellurure de bismuth obtenus par voie électrochimique

A. Zimmer, N. Stein, C. Boulanger, L. Johann

J. Phys. IV France, 122 (2004) 87-92

DOI: https://doi.org/10.1051/jp4:2004122013

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This article has been cited by the following article(s):

Growth Mechanism during the Early Stages of electrodeposition of Bismuth telluride films

Alexandre Zimmer, Laurent Broch, Clotilde Boulanger and Nicolas Stein
Electrochimica Acta 174 376 (2015)
https://doi.org/10.1016/j.electacta.2015.05.190

Optical constants of electroplated Bi2Te3 films by Mueller matrix spectroscopic ellipsometry

A. Zimmer, M. Stchakovsky, N. Stein, et al.
Thin Solid Films 516 (10) 2922 (2008)
https://doi.org/10.1016/j.tsf.2007.06.011

Characterizations of bismuth telluride films from Mott‐Schottky plot and spectroscopic ellipsometry

Alexandre Zimmer, Nicolas Stein, Luc Johann, Herman Terryn and Clotilde Boulanger
Surface and Interface Analysis 40 (3-4) 593 (2008)
https://doi.org/10.1002/sia.2715

In situ analysis of bismuth telluride electrodeposition using combined spectroscopic ellipsometry and electrochemical quartz crystal microbalance

Alexandre Zimmer, Nicolas Stein, Luc Johann, Raphaël Beck and Clotilde Boulanger
Electrochimica Acta 52 (14) 4760 (2007)
https://doi.org/10.1016/j.electacta.2007.01.030