Article cité par

La fonctionnalité Article cité par… liste les citations d'un article. Ces citations proviennent de la base de données des articles de EDP Sciences, ainsi que des bases de données d'autres éditeurs participant au programme CrossRef Cited-by Linking Program. Vous pouvez définir une alerte courriel pour être prévenu de la parution d'un nouvel article citant " cet article (voir sur la page du résumé de l'article le menu à droite).

Article cité :

Phase contrast X-ray microscopy at 4 keV photon energy with 60 nm resolution

U. Neuhäusler, G. Schneider, W. Ludwig, D. Hambach

J. Phys. IV France, 104 (2003) 567-570

DOI: https://doi.org/10.1051/jp4:20030145

PDF (624.6 KB)

Citations de cet article :

The hard x-ray nanotomography microscope at the advanced light source

Joseph B. Nichols, Marco Voltolini, Benjamin Gilbert, Alastair A. MacDowell and Michael W. Czabaj
Review of Scientific Instruments 93 (2) (2022)
https://doi.org/10.1063/5.0076322

Automated quantification of the impact of the wood-decay fungus Physisporinus vitreus on the cell wall structure of Norway spruce by tomographic microscopy

M. J. Fuhr, C. Stührk, B. Münch, F. W. M. R. Schwarze and M. Schubert
Wood Science and Technology 46 (4) 769 (2012)
https://doi.org/10.1007/s00226-011-0442-y

High-resolution differential interference contrast X-ray zone plates: Design and fabrication

Magnus Lindblom, Tomi Tuohimaa, Anders Holmberg, et al.
Spectrochimica Acta Part B: Atomic Spectroscopy 62 (6-7) 539 (2007)
https://doi.org/10.1016/j.sab.2007.03.005

Investigation of phase contrast hard X‐ray microscopy using planar sets of refractive crossed linear parabolic lenses made from SU‐8 polymer

E. Reznikova, T. Weitkamp, V. Nazmov, et al.
physica status solidi (a) 204 (8) 2811 (2007)
https://doi.org/10.1002/pssa.200675690

Non-destructive high-resolution X-ray imaging of ULSI micro-electronics using keV X-ray microscopy in Zernike phase contrast

Ulrich Neuhäusler and Gerd Schneider
Microelectronic Engineering 83 (4-9) 1043 (2006)
https://doi.org/10.1016/j.mee.2006.01.225

Hard X-Ray Nano-Interferometer and Its Application to High-Spatial-Resolution Phase Tomography

Takahisa Koyama, Takuya Tsuji, Keisuke Yoshida, Hidekazu Takano, Yoshiyuki Tsusaka and Yasushi Kagoshima
Japanese Journal of Applied Physics 45 (11L) L1159 (2006)
https://doi.org/10.1143/JJAP.45.L1159

Fabrication of high-resolution zone plates with wideband extreme-ultraviolet holography

Harun H. Solak, Christian David and Jens Gobrecht
Applied Physics Letters 85 (14) 2700 (2004)
https://doi.org/10.1063/1.1803937

The X‐ray Microscopy and Micro‐spectroscopy facility at the ESRF

J. Susini, M. Salomé, U. Neuhaeusler, et al.
Synchrotron Radiation News 16 (3) 35 (2003)
https://doi.org/10.1080/08940880308603020