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Article cité :

rf-sputtering of PMNT thin films

E. Fribourg-Blanc, E. Cattan, D. Remiens, M. Dupont, D. Osmont

J. Phys. IV France, 11 PR11 (2001) Pr11-145-Pr11-149

DOI: https://doi.org/10.1051/jp4:20011123

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Citations de cet article :

Annealing Temperature Effects on PMN-PT Thin Film

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Ferroelectrics 362 (1) 128 (2008)
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INTERFACIAL EFFECTS ON THE CRYSTALLIZATION TEMPERATURE OF PMN-PT FILMS DEPOSITED ON LNO OR Pt BOTTOM ELECTRODES

M. Detalle, T. T. Nguyen, G. S. Wang and D. Remiens
Integrated Ferroelectrics 98 (1) 171 (2008)
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Piezoelectric thin films for MEMS applications—A comparative study of PZT, 0.7PMN–0.3PT and 0.9PMN–0.1PT thin films grown on Si by r.f. magnetron sputtering

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Local Piezoelectric Hysteresis Loops for the Study of Electrical Properties of 0.7Pb(Mg1/3Nb2/ 3)O3-0.3PbTiO3 Thin Films: Bottom Electrode Dependence and Film Thickness Effect

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Low temperature perovskite crystallization of 70%PbMg1∕3Nb2∕3O3–30%PbTiO3 thin films deposited by sputtering and their electrical performance evaluation

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NANOSCALE INVESTIGATIONS OF ELECTRICAL PROPERTIES IN RELAXOR Pb(Mg1/3Nb2/3)O3-PbTiO3 THIN FILMS DEPOSITED ON PLATINUM AND LaNiO3 ELECTRODES BY MEANS OF LOCAL PIEZOELECTRIC RESPONSE

A. FERRI, A. DA COSTA, R. DESFEUX, et al.
Integrated Ferroelectrics 91 (1) 80 (2007)
https://doi.org/10.1080/10584580701320123

Electrostrictive and Piezoelectric Behavior of PMN-PT Thin Films

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Growth of highly orientated 0.65Pb(Mg1/3Nb2/3)O3–0.35PbTiO3 films by pulsed laser deposition

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Surface and Coatings Technology 198 (1-3) 400 (2005)
https://doi.org/10.1016/j.surfcoat.2004.10.131

PMNT films for integrated capacitors

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Solid-State Electronics 47 (10) 1631 (2003)
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