HIGH RESOLUTION ELECTRON BEAM INJECTION IN SEMICONDUCTORS USING A SCANNING TUNNELING MICROSCOPE
J. Phys. IV France, 01 C6 (1991) C6-271-C6-275
Article cité par
La fonctionnalité Article cité par… liste les citations d'un article. Ces citations proviennent de la base de données des articles de EDP Sciences, ainsi que des bases de données d'autres éditeurs participant au programme CrossRef Cited-by Linking Program. Vous pouvez définir une alerte courriel pour être prévenu de la parution d'un nouvel article citant " cet article (voir sur la page du résumé de l'article le menu à droite).
Article cité :
Citations de cet article :
STM Light Emission Spectroscopy of Self-Assembled Monolayer of Alkanethiol on Au Film
Jamal Uddin Ahamed, Satoshi Katano and Yoichi UeharaTransactions of the Indian Institute of Metals 72 (5) 1221 (2019)
https://doi.org/10.1007/s12666-019-01610-6
Mechanism of Prism-Coupled Scanning Tunneling Microscope Light Emission
Wataru Iida, Jamal U. Ahamed, Satoshi Katano and Yoichi UeharaJapanese Journal of Applied Physics 50 (9) 095201 (2011)
https://doi.org/10.1143/JJAP.50.095201
Scanning Tunneling Luminescence of Individual CdSe Nanowires
Theresa Lutz, Alexander Kabakchiev, Thomas Dufaux, et al.Small 7 (16) 2396 (2011)
https://doi.org/10.1002/smll.201100434
Ground-state interband transition of individual self-assembled InAs/Al0.6Ga0.4As quantum dots observed by scanning-tunneling-microscope light-emission spectroscopy
T. Tsuruoka, Y. Ohizumi and S. UshiodaJournal of Applied Physics 95 (3) 1064 (2004)
https://doi.org/10.1063/1.1638612
Spatially resolved scanning tunneling luminescence on self-assembled InGaAs/GaAs quantum dots
S. E. J. Jacobs, M. Kemerink, P. M. Koenraad, et al.Applied Physics Letters 83 (2) 290 (2003)
https://doi.org/10.1063/1.1588732
Light intensity imaging of single InAs quantum dots using scanning tunneling microscope
T. Tsuruoka, Y. Ohizumi and S. UshiodaApplied Physics Letters 82 (19) 3257 (2003)
https://doi.org/10.1063/1.1576509
Electron transport in the barriers of AlGaAs/GaAs quantum well structures observed by scanning-tunneling-microscope light-emission spectroscopy
T. Tsuruoka, R. Tanimoto, Y. Ohizumi, R. Arafune and S. UshiodaApplied Physics Letters 80 (20) 3748 (2002)
https://doi.org/10.1063/1.1480467
Direct measurement of sub-10 nm-level lateral distribution in tunneling-electron luminescence intensity on a cross-sectional 50-nm-thick AlAs layer by using a conductive transparent tip
Tooru Murashita and Kouta TatenoApplied Physics Letters 78 (25) 3995 (2001)
https://doi.org/10.1063/1.1380404