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Cryogenic operation of sub-30 nm nMOSFETs: Impact of device architecture

G. Bertrand, S. Deleonibus, D. Souil, B. Previtali, C. Caillat, G. Guégan, M. Sanquer and F. Balestra

J. Phys. IV France, 12 3 (2002) 45-49

DOI: 10.1051/jp420020034

G. Bertrand

S. Deleonibus

D. Souil

B. Previtali

C. Caillat

G. Guégan

M. Sanquer

F. Balestra

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Copyright / Published by: EDP Sciences