Journal de Physique IV

De la mesure de pertes à la caractérisation dynamique de dispositifs semiconducteurs

L. Lanco, A. De Rossi, S. Ducci, G. Leo, X. Marcadet, M. Calligaro and V. Berger

J. Phys. IV France, 135 (2006) 281-282

Published online: 23 November 2006

DOI: 10.1051/jp4:2006135089

L. Lanco

A. De Rossi

S. Ducci

G. Leo

X. Marcadet

M. Calligaro

V. Berger

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