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Interrogation d'un ion unique pour la métrologie optique

G. Hagel, C. Champenois, C. Lisowski, D. Guyomarc'h, M. Houssin, M. Vedel, M. Knoop and F. Vedel

J. Phys. IV France, 135 (2006) 163-164

Published online: 23 November 2006

DOI: 10.1051/jp4:2006135041

G. Hagel

C. Champenois

C. Lisowski

D. Guyomarc'h

M. Houssin

M. Vedel

M. Knoop

F. Vedel

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