Journal de Physique IV

Determination of thickness and porosity of porous silicon layer using photoacoustic technique

S. Abdalla, T.A. El- Brolossy, G.M. Yossef, S. Negm and H. Talaat

J. Phys. IV France, 125 (2005) 301-304

DOI: 10.1051/jp4:2005125072

S. Abdalla

T.A. El- Brolossy

G.M. Yossef

S. Negm

H. Talaat

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