Journal de Physique IV

Thermal conductivity of transparent thin films/substrates measured by photothermal reflectivity probing method

X. Qi, S.-Y. Zhang, X.-B. Mi, X.-J. Shui and X.-J. Liu

J. Phys. IV France, 125 (2005) 261-264

DOI: 10.1051/jp4:2005125062

X. Qi

S.-Y. Zhang

X.-B. Mi

X.-J. Shui

X.-J. Liu

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