Journal de Physique IV

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Caractérisation par spectrométrie photoélectronique (XPS) et spectrométrie d'émission X (XRFS et LEEIXS) de films minces de Ni ou Cu electroless déposés sur substrats polymères

M. Charbonnier, D. Leonard, Y. Goepfert and M. Romand

J. Phys. IV France, 118 (2004) 193-202

DOI: 10.1051/jp4:2004118023

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