Journal de Physique IV

0

Subscriber Authentication Point

EDPS Account

Search

Menu

Phase-contrast microtomography using an X-ray interferometer having a 40-μm analyzer

A. Momose, I. Koyama, Y. Hamaishi, H. Yoshikawa, T. Takeda, J. Wu, Y. Itai, , K. Takai, K. Uesugi and Y. Suzuki

J. Phys. IV France, 104 (2003) 599-602

DOI: 10.1051/jp4:20030153

A. Momose

I. Koyama

Y. Hamaishi

H. Yoshikawa

T. Takeda

J. Wu

Y. Itai

, K. Takai

K. Uesugi

Y. Suzuki

Articles written by ALL the selected authors (AND)

Articles written by ANY OF the selected authors (OR)

Copyright / Published by: EDP Sciences