Journal de Physique IV

X-ray microscopy by phase-retrieval methods at the advanced light source

M.R. Howells, H. Chapman, S. Hau-Riege, H. He, S. Marchesini, J. Spence and U. Weierstall

J. Phys. IV France, 104 (2003) 557-561

DOI: 10.1051/jp4:20030143

M.R. Howells

H. Chapman

S. Hau-Riege

H. He

S. Marchesini

J. Spence

U. Weierstall

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