Journal de Physique IV

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High lateral resolution spectroscopic imaging of surfaces: The undulator beamline “nanospectroscopy” at Elettra

A. Locatelli, A. Bianco, D. Cocco, S. Cherifi, S. Heun, M. Marsi, M. Pasqualetto and E. Bauer

J. Phys. IV France, 104 (2003) 99-102

DOI: 10.1051/jp4:200300038

A. Locatelli

A. Bianco

D. Cocco

S. Cherifi

S. Heun

M. Marsi

M. Pasqualetto

E. Bauer

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Copyright / Published by: EDP Sciences