Journal de Physique IV

Ordered mesoporous silica and alumina thin films studied by X-ray scattering

M. Klotz, N. Idrissi-Kandri, A. Ayral, A. van der Lee and C. Guizard

J. Phys. IV France, 12 6 (2002) 283-290

DOI: 10.1051/jp4:20020237

M. Klotz

N. Idrissi-Kandri

A. Ayral

A. van der Lee

C. Guizard

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