Journal de Physique IV

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Reliability of resistance/deformation during electrically-driven thermal cycles under stress on Ni₂₅Ti₅₀Cu₂₅ melt spun ribbons

G. Gomarasca, G. Airoldi and A.V. Shelyakov

J. Phys. IV France, 11 PR8 (2001) Pr8-339-Pr8-344

DOI: 10.1051/jp4:2001857

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