Journal de Physique IV

Raman scattering investigation of the structure of amorphous silicon in a-Si/SiO² superlattice films

Y. Wang, O. Matsuda, T. Serikawa and K. Murase

J. Phys. IV France, 10 PR7 (2000) Pr7-259-Pr7-262

DOI: 10.1051/jp4:2000752

Y. Wang

O. Matsuda

T. Serikawa

K. Murase

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