Journal de Physique IV

Subscriber Authentication Point

EDPS Account

Electron diffraction (LACBED) and HRTEM Moiré fringe pattern study of stress in YBaCuO thin film on Mg0

F. Pailloux and R.J. Gaboriaud

J. Phys. IV France, 10 PR6 (2000) Pr6-131-Pr6-135

DOI: 10.1051/jp4:2000623

This search tool will display articles in Google Scholar database by authors of the selected article:

Select your author(s):

F. Pailloux

R.J. Gaboriaud

Search method:

Articles written by ALL the selected authors (AND)

Articles written by ANY OF the selected authors (OR)