Journal de Physique IV

Application of Raman spectrometry for the characterization of complex oxide thin films grown by MOCVD

B. Güttler, O.Yu. Gorbenko, M.A. Novozhilov, S.V. Samoilenkov, V.A. Amelichev, G. Wahl and H.W. Zandbergen

J. Phys. IV France, 09 PR8 (1999) Pr8-1179-Pr8-1186

DOI: 10.1051/jp4:19998147

B. Güttler

O.Yu. Gorbenko

M.A. Novozhilov

S.V. Samoilenkov

V.A. Amelichev

G. Wahl

H.W. Zandbergen

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