Journal de Physique IV

Heat flow measurement in thin films by time resolved ellipsometry

H. El Rhaleb, J.P. Roger, J.L. Stéhlé and A.C. Boccara

J. Phys. IV France, 04 C7 (1994) C7-639-C7-642

DOI: 10.1051/jp4:19947151

H. El Rhaleb

J.P. Roger

J.L. Stéhlé

A.C. Boccara

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