Journal de Physique IV

Micronic thermal characterization of vertical interfaces using the photoreflectance method

F. Lepoutre, Ph. Forge, J.L. Joulaud, L. Paradis and D. Rochais

J. Phys. IV France, 04 C7 (1994) C7-571-C7-574

DOI: 10.1051/jp4:19947134

F. Lepoutre

Ph. Forge

J.L. Joulaud

L. Paradis

D. Rochais

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