Performances and physical mechanisms in sub-0.1 µm gate length LDD MOSFETs at low temperature F. Balestra, H. Nakabayashi, M. Tsuno, T. Matsumoto and M. Koyanagi J. Phys. IV France, 04 C6 (1994) C6-13-C6-18 DOI: 10.1051/jp4:1994602