Journal de Physique IV

Subscriber Authentication Point

EDPS Account

Ellipsometric analysis for CVD thick films on weakly absorbing substrates

M.N. CHURAEVA

J. Phys. IV France, 03 C3 (1993) C3-189-C3-193

DOI: 10.1051/jp4:1993324

This search tool will display articles in our database by authors of the selected article:

Select your author(s):

M.N. CHURAEVA

Search method:

Articles written by ALL the selected authors (AND)

Articles written by ANY OF the selected authors (OR)