Journal de Physique IV

CHARACTERIZATION OF MULTILAYERS ADHERENCE ON GaAs SUBSTRATE BY INFRARED IMAGING AND CORRELATION TO ASSOCIATED MICROSCOPY STUDIES

J.M. TEILLERIE, M. THOLOMIER and J.E BRESSE

J. Phys. IV France, 01 C6 (1991) C6-253-C6-257

DOI: 10.1051/jp4:1991639

J.M. TEILLERIE

M. THOLOMIER

J.E BRESSE

Articles written by ALL the selected authors (AND)

Articles written by ANY OF the selected authors (OR)