Journal de Physique IV

Total Electron Yield Detector Working at Low Temperature for Linear Dichroïsm Studies on Monocrystalline Samples

C. Revenant-Brizard, J.R. Regnard, J. Mimault, D. Duclos and J.J. Faix

J. Phys. IV France, 7 C2 (1997) C2-325-C2-326

DOI: 10.1051/jp4/1997213

C. Revenant-Brizard

J.R. Regnard

J. Mimault

D. Duclos

J.J. Faix

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