X-ray microscopy by phase-retrieval methods at the advanced light source M.R. Howells, H. Chapman, S. Hau-Riege, H. He, S. Marchesini, J. Spence and U. WeierstallJ. Phys. IV France, 104 (2003) 557-561DOI: https://doi.org/10.1051/jp4:20030143
