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Cited article:

X-ray microscopy by phase-retrieval methods at the advanced light source

M.R. Howells, H. Chapman, S. Hau-Riege, H. He, S. Marchesini, J. Spence, U. Weierstall

J. Phys. IV France, 104 (2003) 557-561

DOI: https://doi.org/10.1051/jp4:20030143

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Three-Dimensional Coherent X-Ray Diffraction Imaging of a Ceramic Nanofoam: Determination of Structural Deformation Mechanisms

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Relaxed averaged alternating reflections for diffraction imaging

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