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Cited article:

Comparison of the electrical behavior in the subthreshold region between laser and solid phase crystallized polysilicon thin film transistors

L. Pichon, A. Mercha, R. Carin, et al.
Solid-State Electronics 46 (4) 459 (2002)
https://doi.org/10.1016/S0038-1101(01)00324-0

Thin film transistors fabricated by in situ doped unhydrogenated polysilicon films obtained by solid phase crystallization

L Pichon, K Mourgues, F Raoult, et al.
Semiconductor Science and Technology 16 (11) 918 (2001)
https://doi.org/10.1088/0268-1242/16/11/306

Thermal Activation of the Crystallization Kinetics of Amorphous Silicon

T. Mohammed-Brahim, D. Briand, K. Kis-Sion, et al.
MRS Proceedings 398 387 (1995)
https://doi.org/10.1557/PROC-398-387