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Cited article:

Influence of dopant concentration and type of substrate on the local organization of low-pressure chemical vapour deposition in situ boron doped silicon films from silane and boron trichloride

B. Caussat, E. Scheid, B. de Mauduit and R. Berjoan
Thin Solid Films 446 (2) 218 (2004)
https://doi.org/10.1016/j.tsf.2003.10.010

Comparison of the electrical behavior in the subthreshold region between laser and solid phase crystallized polysilicon thin film transistors

L. Pichon, A. Mercha, R. Carin, et al.
Solid-State Electronics 46 (4) 459 (2002)
https://doi.org/10.1016/S0038-1101(01)00324-0

Density of states in the channel material of low temperature polycrystalline silicon thin film transistors

K Mourgues, A Rahal, T Mohammed-Brahim, et al.
Journal of Non-Crystalline Solids 266-269 1279 (2000)
https://doi.org/10.1016/S0022-3093(99)00937-0

Ageing of laser crystallized and unhydrogenated polysilicon thin film transistors

A. Rahala, T. Mohammed-Brahima, H. Toutah, et al.
Microelectronics Reliability 39 (6-7) 851 (1999)
https://doi.org/10.1016/S0026-2714(99)00112-2