Articles citing this article

The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

Low temperature operation of ultra-thin gate oxide sub-0.1 μm MOSFETs

B. Cretu, F. Balestra, G. Ghibaudo, G. Guégan

J. Phys. IV France, 12 3 (2002) 57-60

DOI: https://doi.org/10.1051/jp420020036

PDF (191.1 KB)

This article has been cited by the following article(s):

Assessment of DC and low-frequency noise performances of triple-gate FinFETs at cryogenic temperatures

B Cretu, D Boudier, E Simoen, A Veloso and N Collaert
Semiconductor Science and Technology 31 (12) 124006 (2016)
https://doi.org/10.1088/0268-1242/31/12/124006

In depth static and low-frequency noise characterization of n-channel FinFETs on SOI substrates at cryogenic temperature

H. Achour, B. Cretu, J.-M. Routoure, et al.
Solid-State Electronics 98 12 (2014)
https://doi.org/10.1016/j.sse.2014.04.001