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Cited article:

Assessment of DC and low-frequency noise performances of triple-gate FinFETs at cryogenic temperatures

B Cretu, D Boudier, E Simoen, A Veloso and N Collaert
Semiconductor Science and Technology 31 (12) 124006 (2016)
https://doi.org/10.1088/0268-1242/31/12/124006

In depth static and low-frequency noise characterization of n-channel FinFETs on SOI substrates at cryogenic temperature

H. Achour, B. Cretu, J.-M. Routoure, et al.
Solid-State Electronics 98 12 (2014)
https://doi.org/10.1016/j.sse.2014.04.001