Articles citing this article

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Cited article:

Effect of thermal annealing on the optical properties of self-assembled Ge/Si quantum dots

T.K. Nguyen-Duc, V. Le Thanh, J. Derrien, V. Yam, P. Boucaud, D. Bouchier

J. Phys. IV France, 132 (2006) 163-170

Published online: 2006-03-11

DOI: https://doi.org/10.1051/jp4:2006132032

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This article has been cited by the following article(s):

Raman Characterization of SiGe Nanostructures Formed by Rapid Thermal Annealing

Alexandre Miranda P. dos Anjos, Ioshiaki Doi and Jose Alexandre Diniz
e-Journal of Surface Science and Nanotechnology 7 301 (2009)
https://doi.org/10.1380/ejssnt.2009.301

Structural characterization of SiGe nanoclusters formed by rapid thermal annealing

Alexandre Miranda P. dos Anjos, Ioshiaki Doi and José Alexandre Diniz
Applied Surface Science 254 (19) 6055 (2008)
https://doi.org/10.1016/j.apsusc.2008.02.119