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Cited article:

Evaluation of active semiconductor structures by combined scanning thermo-elastic microscopy and finite element simulations

J.L. Nzodoum Fotsing, D. Dietzel, S. Chotikaprakhan, R. Meckenstock, J. Pelzl, S. Cassette

J. Phys. IV France, 125 (2005) 117-120

DOI: https://doi.org/10.1051/jp4:2005125027

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This article has been cited by the following article(s):

Abdul Naim Khan, K. Jena, Gaurav Chatterjee, Meenakshi Chauhan and S. Routray
125 (2025)
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Thermal Wave-Based Scanning Probe Microscopy and Its Applications

J. Pelzl, M. Chirtoc and R. Meckenstock
International Journal of Thermophysics 34 (8-9) 1353 (2013)
https://doi.org/10.1007/s10765-013-1485-0