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Cited article:

Improvement of the multilayer morphology (alumina/Cu/YIG/Cu) to characterize YIG thin film

Ismaïl Khalil, Ali Siblini, Jean Pierre Chatelon, Marie Françoise Blanc-Mignon and Jean Jacques Rousseau
physica status solidi (a) 208 (7) 1678 (2011)
https://doi.org/10.1002/pssa.201026511