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Cited article:

Étude d'un empilement multicouche périodique Mo/Si par spectroscopie d'émission X et par réflectométrie X

P. Jonnard, J.-M. André, J. Gautier, M. Roulliay, F. Bridou, F. Delmotte, M.-F. Ravet

J. Phys. IV France, 118 (2004) 231-236

DOI: https://doi.org/10.1051/jp4:2004118027

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This article has been cited by the following article(s):

Non-destructive X-ray study of the interphases in Mo/Si and Mo/B4C/Si/B4C multilayers

H. Maury, P. Jonnard, J.-M. André, et al.
Thin Solid Films 514 (1-2) 278 (2006)
https://doi.org/10.1016/j.tsf.2006.02.073

Analysis of a B4C/Mo/Si multilayer interferential mirror by SIMS: influence of the sputtering ion

H. Maury, P. Holliger, B. Farès, J. Gautier, M. Roulliay, F. Bridou, F. Delmotte, M.‐F. Ravet, J.‐M. André and P. Jonnard
Surface and Interface Analysis 38 (4) 781 (2006)
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Physico-chemical and X-ray optical characterizations of a Mo/Si multilayer interferential mirror upon annealing

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Surface Science 589 (1-3) 164 (2005)
https://doi.org/10.1016/j.susc.2005.05.058

MONOX: a characterization tool for the X-UV range

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The European Physical Journal Applied Physics 31 (2) 147 (2005)
https://doi.org/10.1051/epjap:2005047