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Cited article:

Étude d'un empilement multicouche périodique Mo/Si par spectroscopie d'émission X et par réflectométrie X

P. Jonnard, J.-M. André, J. Gautier, M. Roulliay, F. Bridou, F. Delmotte, M.-F. Ravet

J. Phys. IV France, 118 (2004) 231-236

DOI: https://doi.org/10.1051/jp4:2004118027

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This article has been cited by the following article(s):

Non-destructive X-ray study of the interphases in Mo/Si and Mo/B4C/Si/B4C multilayers

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Thin Solid Films 514 (1-2) 278 (2006)
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Analysis of a B4C/Mo/Si multilayer interferential mirror by SIMS: influence of the sputtering ion

H. Maury, P. Holliger, B. Farès, et al.
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Physico-chemical and X-ray optical characterizations of a Mo/Si multilayer interferential mirror upon annealing

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Surface Science 589 (1-3) 164 (2005)
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MONOX: a characterization tool for the X-UV range

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The European Physical Journal Applied Physics 31 (2) 147 (2005)
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