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Cited article:

High-resolution X-ray diffractometry and X-ray reflectometry techniques for structural studies of complicated thin-layered heterostructures: Complementarity between Fourier Transform-based procedures and simulation softwares

O.Durand, A. De Rossi, A. Bouchier

J. Phys. IV France, 118 (2004) 203-211

DOI: https://doi.org/10.1051/jp4:2004118024

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